Patent number: 10033080
Type: Grant
Filed: May 7, 2014
Date of Patent: Jul 24, 2018
Patent Publication Number: 20150323576
Assignee: Alcatel Lucent (Boulogne-Billancourt)
Inventors: Senad Bulja (Dublin), Rose F. Kopf (Green Brook, NJ)
Primary Examiner: Arleen M Vazquez
Assistant Examiner: Akm Zakaria
Application Number: 14/272,190
In this invention an electrical cell that enables experimental measurements of dielectric properties of an electrochromic material in the radio-frequency range of the electromagnetic spectrum is disclosed. In an example embodiment, the electrical cell includes a layer of the electrochromic material under test that is sandwiched between a conducting base plane and a microstrip line. The conducting base plane and the microstrip line are electrically connected to a co-planar waveguide configured for application of superimposed DC-bias and RF-probe signals using a conventional probe station and a vector network analyzer. The S-parameters of the electrical cell measured in this manner can then be used, e.g., to obtain the complex dielectric constant of the electrochromic material under test as a function of frequency.
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